In a zx.pk.ru I found an interesting project: "IC tester". With chip ATMEGA8515 and 4x7-segment display. You can test logic IC's.
The disadvantage of the schematic that you can not test the high power (high power-consuming) chips. I decided to improve the schematic with the P-mosfet. Advanced version is:
Than all put into box:
It also I had to rewrite microcontroller software that work under the new schematics. New firmware allows test more chips.
If the tested microchip is bad, then the result will be as follows:
If you were trying to test in the search mode and the chip is bad, then the result will be as follows:
To test IC with 24 legs schematic must be like this:
Currently, you can check these chips:
No. |
Testing ICs |
LCD indicator value |
1. |
7400(ЛА3),
7437(ЛА12),
74132(ТЛ3) |
00 |
2. |
7401(ЛА8) |
01 |
3. |
7402(ЛЕ1) |
02 |
4. |
7403(ЛА9),
7426(ЛА11),
7438(ЛА13) |
03 |
5. |
7404(ЛН1),
7414(ТЛ2),
CD4049A(561ЛН2) |
04 |
6. |
7405(ЛН2),
7406(ЛН3) |
05 |
7. |
7407(ЛП9) |
07 |
8. |
7408(ЛИ1) |
08 |
9. |
7409(ЛИ2) |
09 |
10. |
7410(ЛА4) |
10 |
11. |
7411(ЛИ3) |
11 |
12. |
(531ЛА17) |
l17 |
13. |
7420(ЛА1),
7440(ЛА6) |
20 |
14. |
7421(ЛИ6) |
21 |
15. |
7422(ЛА7) |
22 |
16. |
7427(ЛЕ4) |
27 |
17. |
7430(ЛА2) |
30 |
18. |
7432(ЛЛ1) |
32 |
19. |
7433(ЛЕ11) |
33 |
20. |
7472(ТВ1) |
72 |
21. |
7474(ТМ2) |
74 |
22. |
7486(ЛП5) |
86 |
23. |
7490(ИЕ2) |
90 |
24. |
7493(ИЕ5) |
93 |
25. |
7495(ИР1) |
95 |
26. |
74107(ТВ6) |
107 |
27. |
74125(ЛП8) |
125 |
28. |
74138(ИД7) |
138 |
29. |
74139(ИД14) |
139 |
30. |
74151(КП7) |
151 |
31. |
74153(КП2) |
153 |
32. |
74155(ИД4) |
155 |
33. |
74155(ИД5) |
156 |
34. |
74157(КП16) |
157 |
35. |
74160(ИЕ9) |
160 |
36. |
74161(ИЕ10) |
161 |
37. |
74165(ИР9) |
165 |
38. |
74166(ИР10) |
166 |
39. |
74169(ИЕ17) |
169 |
40. |
74174(TM9) |
174 |
41. |
74175(TM8) |
175 |
42. |
74193(ИЕ7) |
193 |
43. |
74240(АП3) |
240 |
44. |
74244(АП5) |
244 |
45. |
74245(АП6) |
245 |
46. |
74251(КП15) |
251 |
47. |
74253(КП12) |
253 |
48. |
74257(КП11) |
257 |
49. |
74258(КП14) |
258 |
50. |
74273(ИР35) |
273 |
51. |
74295(ИР16) |
295 |
52. |
74298(КП13) |
298 |
53. |
74366(ЛН6) |
366 |
54. |
74367(ЛП11) |
367 |
55. |
74373(ИР22) |
373 |
56. |
74374(ИР23) |
374 |
57. |
74377(ИР27) |
377 |
58. |
74393(ИЕ19) |
393 |
59. |
74541(АП13) |
541 |
60. |
74573(ИР33) |
573 |
61. |
74574(ИР37) |
574 |
62. |
744040 |
u40 |
63. |
75452(ЛА18) |
452 |
64. |
CD4502(561ЛН1) |
C02 |
65. |
CD4516(561ИЕ11) |
C16 |
66. |
CD4520(561ИЕ10) |
C20 |
67. |
CD4066(561КТ3) |
C66 |
68. |
i8216(589АП16) |
i16 |
69. |
i8216(589АП26) |
i26 |
70. |
i8282(580ИР82) |
i82 |
71. |
i8283(580ИР83) |
i83 |
72. |
i8286(580ВА86) |
i86 |
73. |
i8287(580ВА87) |
i87 |
74. |
74150(КП1) |
150 |
75. |
74154(ИД3) |
154 |
76. |
74198(ИР13) |
198 |
Next, I will try to do static and dynamic IC testing.
Firmwares:
- IC-Tester by Ewgeny7 v1.30
- IC-Tester v1.1,v2.0 by Protom v1.30